ET4277 Microelectronics reliability

Topics: Reliability issues involved in electronic components and system

This course aims to provide the students with a thorough understanding of the reliability issues involved in electronic components and systems. The following subjects will be treated.

  • Basic reliability definition and lifetime distributions.
  • Reliability prediction methods.
  • Physical failure mechanisms in electronic components
  • Package related failures
  • Reliability screening and reliability testing
  • Failure analysis methods
  • Reliability data handling
  • Design considerations
  • System reliability


prof.dr. GuoQi Zhang (ECTM)

Heterogenous system integration, 2D materials and devices, wide bandgap semiconductor sensors, digital twin and reliability, multi-scale and multi-physics modeling Willem van Driel (ECTM)

Solid-state lighting reliability

Last modified: 2023-04-13


Credits: 4 EC
Period: 0/0/3/0
Contact: Willem van Driel