dr. E Margallo-Balbas

1. Experimental characterization of roughness induced scattering losses in PECVD SiC waveguides
   G. Pandraud; E. Margallo-Balbas; C.K. Yang; P.J. French;
   Journal of Lightwave Technology,
   Volume 29, Issue 5, pp. 744-749, 2011. DOI 10.1109/JLT.2011.2108264.

2. Low power PECVD SIC delay lines for optical coherence tomography in the visible
   G. Pandraud; L. Mele; B. Morana; E. Margallo-Balbas; P.J. French; P.M. Sarro;
   In 16th International Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS 2011),
   Beijing, China, pp. 1554-1557, Jun. 2011. ISBN 978-1-4577-0157-3; DOI 10.1109/TRANSDUCERS.2011.5969736.

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